Building on the history and success of FEI's pioneering DualBeam, low vacuum and ESEM™ expertise, FEI introduces the most versatile DualBeam instrument to date. The Versa 3D offers state-of-the-art imaging and analytical performance to deliver a greater range of 3D data from even your most challenging samples.
Versa 3D's highly configurable platform allows customers to adapt the system's capabilities to their specific requirements. The combination of high and low vacuum modes gives the flexibility to work with a range of samples including uncoated and non-conductive samples.
Optional ESEM mode allows electron beam imaging of naturally hydrated samples and supports in situ analysis and experimentation with additional dynamic temperature stages.